DocumentCode :
1360486
Title :
Test economics in the 2lst Century
Author :
Turino, Jon
Author_Institution :
Integrated Meas. Syst., Beaverton, OR, USA
Volume :
14
Issue :
3
fYear :
1997
Firstpage :
41
Lastpage :
44
Abstract :
Although it is clearly risky to make predictions about what may occur several years in the future, sometimes such projections are necessary. If we have no idea where we are heading and why, the journey may be fraught with even more pitfalls than the constantly changing environment we live in today. And, although change is a constant, some things will stay the same as they have over the last decade or so because they are based on sound reasoning and market dynamics. The author explores the forces driving design validation testing and production testing as we move into the new century
Keywords :
economics; production testing; 2lst Century; design validation testing; market dynamics; production testing; test economics; Built-in self-test; Circuit testing; Computer aided engineering; Design engineering; Design for testability; Hardware; Product design; Product development; Production; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/54.605993
Filename :
605993
Link To Document :
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