• DocumentCode
    1360588
  • Title

    Frequency response identification of the dynamics of a Tokamak plasma

  • Author

    Coutlis, Alex ; Limebeer, David J n ; Wainwright, John Peter ; Lister, Jonathan B. ; Vyas, Parag

  • Author_Institution
    Centre for Process Syst. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
  • Volume
    8
  • Issue
    4
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    646
  • Lastpage
    659
  • Abstract
    We describe the application of an H system identification procedure to a Tokamak. The work is motivated by the need to create linear models which are suitable for controller design and which may be used to validate different models derived from physics principles. The paper develops an H system identification algorithm and demonstrates its successful application to the Tokamak configuration variable (TCV). Each of the required steps is detailed, from the design of identification experiments to the creation of low-order models from a combination of Hankel model reduction and Chebychev approximation. The method described is a worst-case identification technique, in that it aims to minimize the H error between the identified model and the true plant. Such a model is particularly well suited for robust controller design. The identified model of TCV is compared with various physics-based models
  • Keywords
    Chebyshev approximation; H control; Tokamak devices; dynamics; frequency response; frequency-domain analysis; identification; reduced order systems; robust control; Chebychev approximation; H control; Hankel model reduction; Tokamak configuration variable; Tokamak plasma; dynamics; frequency domain analysis; frequency response; identification; robust control; Coils; Frequency response; Plasma applications; Plasma confinement; Plasma density; Plasma devices; Plasma temperature; System identification; Tokamaks; Toroidal magnetic fields;
  • fLanguage
    English
  • Journal_Title
    Control Systems Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-6536
  • Type

    jour

  • DOI
    10.1109/87.852910
  • Filename
    852910