DocumentCode
1360640
Title
IC failure analysis: the importance of test and diagnostics
Author
Vallett, David P.
Author_Institution
IBM Corp., Essex Junction, VT, USA
Volume
14
Issue
3
fYear
1997
Firstpage
76
Lastpage
82
Abstract
Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process
Keywords
VLSI; failure analysis; integrated circuit testing; IC failure analysis; customer satisfaction; diagnostics; fault localization; quick corrective action; root-cause failure analysis; test; yield; Chemical analysis; Chemical processes; Circuit faults; Dry etching; Failure analysis; Hardware; Inspection; Integrated circuit testing; Manufacturing processes; Wiring;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.606001
Filename
606001
Link To Document