Title :
IC failure analysis: the importance of test and diagnostics
Author :
Vallett, David P.
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Abstract :
Continuous improvements in yield, reliability, time to market, and customer satisfaction all benefit from quick corrective action through root-cause failure analysis. The author reviews software- and hardware-based diagnostic methods for fault localization, the first and most critical step in this process
Keywords :
VLSI; failure analysis; integrated circuit testing; IC failure analysis; customer satisfaction; diagnostics; fault localization; quick corrective action; root-cause failure analysis; test; yield; Chemical analysis; Chemical processes; Circuit faults; Dry etching; Failure analysis; Hardware; Inspection; Integrated circuit testing; Manufacturing processes; Wiring;
Journal_Title :
Design & Test of Computers, IEEE
