• DocumentCode
    1360647
  • Title

    Automated diagnosis in testing and failure analysis

  • Author

    Butler, Kenneth M. ; Johnson, Karl ; Platt, Jeff ; Kinra, Anjali ; Saxena, Jayashree

  • Author_Institution
    Texas Instrum., USA
  • Volume
    14
  • Issue
    3
  • fYear
    1997
  • Firstpage
    83
  • Lastpage
    89
  • Abstract
    To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming mandatory. The authors describe the development and deployment of an automated diagnosis methodology within Texas Instruments
  • Keywords
    failure analysis; integrated circuit manufacture; semiconductor device testing; Texas Instruments; automated diagnosis; defective silicon; failure analysis; semiconductor products; testing; Automatic test pattern generation; Automatic testing; Failure analysis; Instruments; Logic testing; Manufacturing; Production; Qualifications; Semiconductor device testing; Silicon;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.606003
  • Filename
    606003
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1360647