Title :
Automated diagnosis in testing and failure analysis
Author :
Butler, Kenneth M. ; Johnson, Karl ; Platt, Jeff ; Kinra, Anjali ; Saxena, Jayashree
Author_Institution :
Texas Instrum., USA
Abstract :
To meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming mandatory. The authors describe the development and deployment of an automated diagnosis methodology within Texas Instruments
Keywords :
failure analysis; integrated circuit manufacture; semiconductor device testing; Texas Instruments; automated diagnosis; defective silicon; failure analysis; semiconductor products; testing; Automatic test pattern generation; Automatic testing; Failure analysis; Instruments; Logic testing; Manufacturing; Production; Qualifications; Semiconductor device testing; Silicon;
Journal_Title :
Design & Test of Computers, IEEE
