Title :
Modeling the unmodelable: algorithmic fault diagnosis
Author :
Aitken, Robert C.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
Because defect behavior is so variable, a fault model always leaves some faults unmodeled. One solution is to use improved matching algorithms to diagnose complex behaviors even with inaccurate modeling
Keywords :
failure analysis; fault diagnosis; logic testing; algorithmic fault diagnosis; diagnose complex behaviors; fault diagnosis; fault model; matching algorithms; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Contamination; Delay; Failure analysis; Fault diagnosis; Semiconductor device modeling; Shape;
Journal_Title :
Design & Test of Computers, IEEE
