• DocumentCode
    1360660
  • Title

    Modeling the unmodelable: algorithmic fault diagnosis

  • Author

    Aitken, Robert C.

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA, USA
  • Volume
    14
  • Issue
    3
  • fYear
    1997
  • Firstpage
    98
  • Lastpage
    103
  • Abstract
    Because defect behavior is so variable, a fault model always leaves some faults unmodeled. One solution is to use improved matching algorithms to diagnose complex behaviors even with inaccurate modeling
  • Keywords
    failure analysis; fault diagnosis; logic testing; algorithmic fault diagnosis; diagnose complex behaviors; fault diagnosis; fault model; matching algorithms; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Contamination; Delay; Failure analysis; Fault diagnosis; Semiconductor device modeling; Shape;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.606006
  • Filename
    606006
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1360660