DocumentCode
1360673
Title
Built-in self-test for designers
Volume
14
Issue
3
fYear
1997
Firstpage
113
Lastpage
121
Keywords
Automatic testing; Built-in self-test; Central Processing Unit; Circuit testing; Design automation; Energy management; Manufacturing processes; Microprocessors; Pins; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1997.606009
Filename
606009
Link To Document