DocumentCode :
1360924
Title :
Efficient Methods for Large Resistor Networks
Author :
Rommes, Joost ; Schilders, Wil H A
Volume :
29
Issue :
1
fYear :
2010
Firstpage :
28
Lastpage :
39
Abstract :
Large resistor networks arise during the design of very-large-scale integration chips as a result of parasitic extraction and electro static discharge analysis. Simulating these large parasitic resistor networks is of vital importance, since it gives an insight into the functional and physical performance of the chip. However, due to the increasing amount of interconnect and metal layers, these networks may contain millions of resistors and nodes, making accurate simulation time consuming or even infeasible. We propose efficient algorithms for three types of analysis of large resistor networks: 1) computation of path resistances; 2) computation of resistor currents; and 3) reduction of resistor networks. The algorithms are exact, orders of magnitude faster than conventional approaches, and enable simulation of very large networks.
Keywords :
Algorithm design and analysis; Circuit simulation; Computational modeling; Computer networks; Electrostatic discharge; Immune system; Integrated circuit interconnections; Resistors; Semiconductor diodes; Very large scale integration; Approximate minimum degree; Cholesky decomposition; electro static discharge analysis; graph algorithms; large-scale systems; model order reduction; parasitic extraction; path resistance; resistor networks; strongly connected components; two-connected components;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2009.2034402
Filename :
5356296
Link To Document :
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