• DocumentCode
    136096
  • Title

    Doping mechanism of helium-based plasma

  • Author

    Fuse, G. ; Kuriyama, M. ; Sugitani, M. ; Tanaka, Mitsuru

  • Author_Institution
    SEN Corp., Saijo, Japan
  • fYear
    2014
  • fDate
    June 26 2014-July 4 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The mechanism of helium-based plasma doping (He-PD) was investigated. It is found out for the first time that the mechanism is that dopant atoms are knocked-on by a huge number of helium atoms, born out by the results of experiments of helium plasma irradiation following the ultra-low energy implantations. Boron and phosphorous atoms are knocked-on to the almost same depth. Arsenic ions are also evaluated and deeper depth doping than boron and phosphorous is observed. Additionally, it is not necessarily the case that the profile by the He-PD shows steeper abruptness than conventional ion implantation but it is limited to the low power condition. The moving distance by helium irradiation does not depend on atom mass but it correlates linearly to the atom radius. Large atoms such as arsenic moves more than smaller atoms like boron and phosphorous.
  • Keywords
    arsenic; boron; doping; phosphorus; plasma materials processing; As; B; P; arsenic ions; atom mass; atom radius; dopant atoms; helium plasma irradiation; helium-based plasma doping mechanism; low power condition; moving distance; ultralow energy implantations; Atomic measurements; Boron; Doping; Helium; Ions; Plasmas; Radiation effects; knock-on; plasma doping; ultra shallow;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology (IIT), 2014 20th International Conference on
  • Conference_Location
    Portland, OR
  • Type

    conf

  • DOI
    10.1109/IIT.2014.6939957
  • Filename
    6939957