DocumentCode
136096
Title
Doping mechanism of helium-based plasma
Author
Fuse, G. ; Kuriyama, M. ; Sugitani, M. ; Tanaka, Mitsuru
Author_Institution
SEN Corp., Saijo, Japan
fYear
2014
fDate
June 26 2014-July 4 2014
Firstpage
1
Lastpage
4
Abstract
The mechanism of helium-based plasma doping (He-PD) was investigated. It is found out for the first time that the mechanism is that dopant atoms are knocked-on by a huge number of helium atoms, born out by the results of experiments of helium plasma irradiation following the ultra-low energy implantations. Boron and phosphorous atoms are knocked-on to the almost same depth. Arsenic ions are also evaluated and deeper depth doping than boron and phosphorous is observed. Additionally, it is not necessarily the case that the profile by the He-PD shows steeper abruptness than conventional ion implantation but it is limited to the low power condition. The moving distance by helium irradiation does not depend on atom mass but it correlates linearly to the atom radius. Large atoms such as arsenic moves more than smaller atoms like boron and phosphorous.
Keywords
arsenic; boron; doping; phosphorus; plasma materials processing; As; B; P; arsenic ions; atom mass; atom radius; dopant atoms; helium plasma irradiation; helium-based plasma doping mechanism; low power condition; moving distance; ultralow energy implantations; Atomic measurements; Boron; Doping; Helium; Ions; Plasmas; Radiation effects; knock-on; plasma doping; ultra shallow;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology (IIT), 2014 20th International Conference on
Conference_Location
Portland, OR
Type
conf
DOI
10.1109/IIT.2014.6939957
Filename
6939957
Link To Document