DocumentCode
1361209
Title
Plate mode propagation losses in solidly mounted resonators
Author
Thalmayr, F. ; Hashimoto, Koji ; Omori, Tatsuya ; Yamaguchi, Masaki
Author_Institution
Grad. Sch. of Eng., Chiba Univ., Chiba, Japan
Volume
57
Issue
12
fYear
2010
fDate
12/1/2010 12:00:00 AM
Firstpage
2844
Lastpage
2849
Abstract
This paper investigates the acoustic losses of propagating eigenmodes through the acoustic mirror of a solidly mounted resonator (SMR) to clarify how resonator properties are influenced by reflection coefficients for the thickness shear (TS) wave as well as that for the thickness extensional (TE) wave. To this end, we analyze the effective acoustic admittance for several test structures with different mirror properties. Leaky modes are distinguished from plate-like modes and the propagation losses are quantified by calculating mode quality factors. The dependence of the propagation properties of leaky eigenmodes is compared with the mirror properties in terms of bulk wave transmission coefficients obtained by the one-dimensional Mason´s model. It is shown that the TE-like main mode couples with TS-like spurious modes, which then influence the leaky loss of the main mode as well. The coupling strength is strongly frequency-dependent and drastically changes with the mirror design. This result explains previous experimental results reported on SMR design.
Keywords
Q-factor; acoustic wave propagation; acoustic wave reflection; acoustic wave transmission; bulk acoustic wave devices; mirrors; reflectivity; resonators; acoustic admittance; acoustic loss; acoustic mirror; bulk wave transmission coefficients; coupling strength; extensional wave; frequency-dependence; leaky eigenmodes; leaky modes; mode quality factors; one-dimensional Mason model; plate mode propagation loss; reflection coefficients; shear wave-like spurious modes; solidly mounted resonators; Acoustics; Dispersion; Electrodes; Propagation losses; Resonators; Substrates;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2010.1759
Filename
5610571
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