• DocumentCode
    1361391
  • Title

    Impact of Sidewall Roughness on Integrated Bragg Gratings

  • Author

    Simard, A.D. ; Ayotte, N. ; Painchaud, Y. ; Bédard, S. ; LaRochelle, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. Laval, Quebec City, QC, Canada
  • Volume
    29
  • Issue
    24
  • fYear
    2011
  • Firstpage
    3693
  • Lastpage
    3704
  • Abstract
    A major issue in the fabrication of integrated Bragg grating (IBG) filters in highly confined waveguides is the average effective index fluctuations caused by sidewall roughness. In this work, we model the impact of this effect on IBG spectral responses and we identify key parameters that need to be controlled in order to minimize distortions. We show that only low spatial frequency components of the noise are relevant to the calculation of the IBG spectral response, which decreases considerably the computation time. Furthermore, we present an IBG emulator that allows estimation of expected fabrication yield of specific gratings given that the fabrication process is well characterized. The analysis of apodized gratings is used as an example to illustrate how this modeling can help to reduce development cost by first studying robustness of IBG designs to fabrication limitations. Finally, we study analytically the impact of sidewall roughness having short correlation lengths and small roughness variances on the spectral response of weak gratings.
  • Keywords
    Bragg gratings; integrated optics; optical control; optical distortion; optical fibre fabrication; optical noise; silicon-on-insulator; surface roughness; IBG emulator; Si; apodized gratings; average effective index fluctuations; confined waveguides; correlation lengths; integrated Bragg grating filters; roughness variances; sidewall roughness; spatial frequency; spectral responses; Bragg gratings; Integrated optics; Optical filters; Silicon on insulator technology; Surface roughness; Bragg grating; integrated optics; optical filter; photonic wires; sidewall roughness; silicon-on-insulator; weak grating approximation;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2011.2173556
  • Filename
    6060839