• DocumentCode
    1361639
  • Title

    Hunting Down the Bubble Makers in Fabs

  • Author

    Hassoun, M. ; Rabinowitz, G.

  • Author_Institution
    Ind. Eng. & Manage. Dept., Ben Gurion Univ. of the Negrev, Beer-Sheva, Israel
  • Volume
    23
  • Issue
    1
  • fYear
    2010
  • Firstpage
    13
  • Lastpage
    20
  • Abstract
    Based on a simulated non volatile memory fab, we employ data-mining to identify and quantify the apparent causes of work in process bubbles along the process. The chosen bubble formalization methods proved able to detect the phenomenon and enabled its occurrence frequency to be forecasted. In the chosen environment, bubbles seem to be highly correlated with the utilization patterns of the process segment considered.
  • Keywords
    bubbles; data mining; electronic engineering computing; random-access storage; bubble formalization methods; data mining; simulated nonvolatile memory fab; work-in-process; Production management; congestion; semiconductors; work-in-process;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2009.2039244
  • Filename
    5357373
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1361639