Comparison of power dependence of microwave surface resistance of unpatterned and patterned YBCO thin film

The effect of the patterning process on the nonlinearity of the microwave surface resistance R_s of YBCO thin films is investigated in this paper. With the use of a sapphire dielectric resonator and a stripline resonator, the microwave R_s of YBCO thin films was measured before and after the patterning process, as a function of temperature and the RF peak magnetic field in the film. The microwave loss was also modeled, assuming a J_rf² dependence of Z_s(J_rf) on current density J_rf . Experimental and modeled results show that the patterning has no observable effect on the microwave residual R_s or on the power dependence of R_s