• DocumentCode
    1361864
  • Title

    Automatic test generation algorithms for analogue circuits

  • Author

    Soma, M.

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • Volume
    143
  • Issue
    6
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    366
  • Lastpage
    373
  • Abstract
    The author reviews the recently published automatic test generation algorithms for analogue circuits, focusing on their applicability to specific circuit classes, limitations in more general applications and possible improvements. Selected new test generation paradigms, involving design-for-test and BIST techniques, are also discussed to indicate future directions in test generation
  • Keywords
    analogue integrated circuits; automatic test software; built-in self test; design for testability; integrated circuit testing; ATPG algorithms; BIST techniques; DFT techniques; analogue circuits; automatic test generation algorithms; design-for-test techniques;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19960898
  • Filename
    561137
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1361864