DocumentCode :
1362025
Title :
Calculated electron and hold spatial ionization profiles in bulk GaAs and superlattice avalanche photodiodes
Author :
Brennan, Kevin
Author_Institution :
Sch. of Electr. Eng. & Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
24
Issue :
10
fYear :
1988
fDate :
10/1/1988 12:00:00 AM
Firstpage :
2001
Lastpage :
2006
Abstract :
The author presents ensemble Monte Carlo calculations of the electron and hole spatial and temporal impact ionization profiles in bulk GaAs and GaAs-AlGaAs superlattice structures. The results indicate that transient effects are much more pronounced for electrons than for holes, which greatly influences the dynamics of each type. It is concluded that the heterointerface plays less of a role in the hole ionization process than that for electrons due to the small valence band edge discontinuity and to the weaker nonlinear, transient effects experiences by the holes
Keywords :
III-V semiconductors; Monte Carlo methods; avalanche photodiodes; electron impact; gallium arsenide; GaAs; GaAs-AlGaAs; III-V semiconductors; Monte Carlo calculations; electrons; heterointerface; hold spatial ionization profiles; hole ionization process; superlattice avalanche photodiodes; superlattice structures; valence band edge discontinuity; Avalanche photodiodes; Bandwidth; Charge carrier processes; Electrons; Gallium arsenide; Impact ionization; Monte Carlo methods; Noise reduction; Steady-state; Superlattices;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.8535
Filename :
8535
Link To Document :
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