• DocumentCode
    1362105
  • Title

    Frequency de-aliased FFT analysis of step-like functions

  • Author

    Cormack, G.D. ; McMullin, J.N.

  • Author_Institution
    Telecommun. Res. Lab., Edmonton, Alta., Canada
  • Volume
    40
  • Issue
    4
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    773
  • Lastpage
    775
  • Abstract
    The authors present a method for decreasing aliasing error in the fast Fourier transform (FFT) of step-like functions. This technique substantially decreases the sole remaining significant error in the extended function FFT (EF-FFT) method and is implemented by multiplying the EF-FFT spectral results with a simple de-aliasing function based on a piecewise linear model for the shape of the original function between data points. The attractive features of the aliasing error reduction method introduced, compared to increasing the sampling rate, are that data reacquisition is not required, computer requirements are small, and the spectra are of high accuracy up to the Nyquist frequency. The applicability is limited to functions that can be modeled with linear transitions between data points, as opposed to step transitions unless the precise timing and shape of the step transitions are known. Since most data sets are comprised of samples from slowly varying analog signals, the de-aliasing procedure provides enhanced spectral accuracy with minor additional mathematical complexity
  • Keywords
    fast Fourier transforms; functional analysis; spectral analysis; FFT analysis; Nyquist frequency; aliasing error reduction; computer; de-aliasing; extended function FFT; fast Fourier transform; linear transitions; piecewise linear model; spectral accuracy; step-like functions; Computer errors; Data acquisition; Frequency; Piecewise linear techniques; Sampling methods; Shape; Signal analysis; Signal resolution; Spectral analysis; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.85351
  • Filename
    85351