DocumentCode
1362308
Title
Magnetic force microscopy studies of DC erasure in a 5 Gbit/in2 medium [CoCrPtTa/CrMo]
Author
Abarra, E.N. ; Suzuki, T.
Author_Institution
Inf. Storage Mater. Lab., Toyota Technol. Inst., Nagoya, Japan
Volume
34
Issue
2
fYear
1998
fDate
3/1/1998 12:00:00 AM
Firstpage
363
Lastpage
365
Abstract
The DC erasure process in a 5 Gbits/in2 medium is investigated using magnetic force microscopy (MFM). 50 to 250 kfci patterns were imaged in the remanent state after application of in situ magnetic fields perpendicular H⊥ and parallel H| to the tracks. Degradation of bits is observed to start at the track edges and the transitions. Decay at the transition tends to occur locally at many places and propagates into the bits with opposing magnetization relative to H|. For H⊥, decay occurs on both sides of the transition and the written bits persist at higher fields compared to the application of H|. For the H | case, the averaged MFM signal for 50 to 250 kfci patterns fits the bulk DC demagnetization curve suggesting the reduced effect of demagnetizing fields
Keywords
Barkhausen effect; chromium alloys; cobalt alloys; demagnetisation; ferromagnetic materials; magnetic force microscopy; magnetic recording; remanence; CoCrPtTa-CrMo; DC erasure; averaged MFM signal; bit degradation; bulk DC demagnetization curve; demagnetizing fields; magnetic force microscopy studies; remanent state; track edges; written bits; Force measurement; Hall effect devices; Magnetic field measurement; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetic properties; Magnetic separation; Magnetization; Magnetostatics;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.667764
Filename
667764
Link To Document