Title :
Genetic Algorithm applied to the optimized project of semiconductor microcavity lasers
Author :
Cotta, E.A. ; Vilela Neto, Omar P. ; da Silva Coelho, Fernando C.
Author_Institution :
Dept. de Fis. - Manaus, Univ. Fed. do Amazonas, Manaus, Brazil
Abstract :
The application of new computational tools to design optimized devices is an important opportunity to minimize resources for its production. Moreover, these tools can ensure the correct operation of the devices, reaching its operating limit. In this paper we present the first quantitative study of parameters optimization for semiconductor microcavities synthesis under uncertainty using a genetic algorithm. These structures have been used in important studies of several areas for technological or purely scientific purposes. However, the definition of the optimal set of parameters for the fabrication of microcavities is a difficult task. Thus, the device can present different properties from those desired. Based on the reflectance spectra of a AlxGa1-xAs semiconductor microcavity, our goal is to find the optimal parameter set (aluminum concentrations x, thickness and the number of the layers). This set of parameters may offer increased robustness in the growth process, while providing a considerable Quality Factor and the desired position of the cavity resonance. The results indicate that the proposed algorithm is able to find satisfactory solutions by minimizing the problems caused by inaccuracy in the growth of these devices.
Keywords :
III-V semiconductors; Q-factor; aluminium compounds; genetic algorithms; laser beams; microcavity lasers; microfabrication; optical fabrication; semiconductor lasers; AlxGa1-xAs; AlxGa1-xAs semiconductor microcavity; Quality Factor; cavity resonance position; computational tools; device correct operation; device growth; genetic algorithm; growth process; microcavity fabrication; operating limit; optimal parameter set; optimal set; optimized device design; optimized project; parameter optimization; reflectance spectra; semiconductor microcavity lasers; semiconductor microcavity synthesis; Atmospheric measurements; Measurement uncertainty; Particle measurements; Robustness; Semiconductor device measurement; Substrates; AlxGa(1−x)As; genetic algorithm; laser; microcavity; reflectance spectrum;
Conference_Titel :
Microelectronics Technology and Devices (SBMicro), 2014 29th Symposium on
Conference_Location :
Aracaju
DOI :
10.1109/SBMicro.2014.6940103