DocumentCode
1362313
Title
MR recording media: microstructure and magnetic properties
Author
Chen, Ga-Lane
Author_Institution
Seagate Technol., Milpitas, CA, USA
Volume
34
Issue
2
fYear
1998
fDate
3/1/1998 12:00:00 AM
Firstpage
366
Lastpage
371
Abstract
To achieve high recording areal density, it is required that future MR media have high coercivity (Hc), high coercive and remanent squareness (S* and S), low media noise and narrow track recording performance. The microstructure, which strongly affects magnetic properties, should be fully controlled in media fabrication process. The microstructural characteristics like grain size, grain separation, orientation, lattice mismatch, second phases, and stacking faults can affect intergranular magnetic coupling and media noise. The composition of ternary and quaternary cobalt alloy systems, e.g. CoCrTa, CoCrPt, and CoCrPtTa, has significant effects on magnetic performances. The underlayer design, e.g. Cr, CrVx, and CrTix, can affect lattice mismatch, stacking fault density, and other microstructural features. Stress, shadowing, preferred orientation, and c-axis alignment are four mechanisms which control orientation ratio (OR). Oriented medium has more stress-induced noise than isotropic medium has. Thin film medium with bicrystal structure has 5 dB better SNR than non-bicrystal medium. Ultra clean sputtering process (UC-process) can enhance coercivity and reduce noise. For GMR recording media, it requires Hc>3000 Oe and Mrt <0.5 memu/cm2. Media with CoCrPtTa, and CoSm/Cr design will be compared for areal density upto 10 Gb/in2. Mechanisms of high coercive force and low noise in MR media are reviewed in connection with microstructure and magnetic properties
Keywords
coercive force; giant magnetoresistance; grain size; magnetic recording noise; magnetic thin films; magnetoresistive devices; remanence; stacking faults; CoCrPt; CoCrPtTa; CoCrTa; GMR recording media; MR recording media; bicrystal structure; c-axis alignment; coercivity; grain separation; grain size; intergranular magnetic coupling; isotropic medium; lattice mismatch; magnetic properties; media fabrication process; media noise; orientation; orientation ratio; preferred orientation; recording areal density; remanent squareness; second phases; shadowing; stacking fault density; stress-induced noise; track recording performance; ultraclean sputtering process; underlayer design; Chromium; Coercive force; Lattices; Magnetic noise; Magnetic properties; Magnetic recording; Magnetic separation; Microstructure; Sputtering; Stacking;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.667765
Filename
667765
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