DocumentCode
1362396
Title
The measurement of equivalent source match
Author
Ulriksson, Bengt A.
Author_Institution
Lucas Weinschel Inc., Gaithersburg, MD, USA
Volume
40
Issue
4
fYear
1991
fDate
8/1/1991 12:00:00 AM
Firstpage
782
Lastpage
784
Abstract
A method for measuring the source match of leveled sources that involves measuring the S-parameters of the device used to sample the output power is discussed. It is shown that it is possible to measure source match of a leveled source using a vector network analyzer. The mean difference between this system and the traditional slotted line/sliding short method is less than ±0.005. The method thus shows no systematic error. The maximum difference between the two methods is typically ±0.015. The method is fast and easy to apply once the network analyzer is calibrated
Keywords
S-parameters; electric variables measurement; error analysis; microwave generation; microwave measurement; network analysers; S-parameters; equivalent source match; leveled sources; systematic error; vector network analyzer; Attenuation measurement; Frequency; Measurement techniques; Power generation; Power measurement; Reflection; Sampling methods; Scattering parameters; Signal generators; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.85355
Filename
85355
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