• DocumentCode
    1362682
  • Title

    Instrumentation: Automated board testing: Coping with complex circuits: As printed circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue

  • Author

    Tulloss, R.E.

  • Author_Institution
    Western Electric Co., Princeton, NJ, USA
  • Volume
    20
  • Issue
    7
  • fYear
    1983
  • fDate
    7/1/1983 12:00:00 AM
  • Firstpage
    38
  • Lastpage
    43
  • Abstract
    As printed-circuit boards become harder to test due to VLSI components, automated systems and new design techniques are coming to the rescue. The author outlines the use of automatic test equipment (ATE).
  • Keywords
    automatic test equipment; electronic equipment testing; printed circuits; production testing; ATE; VLSI; automatic test equipment; printed-circuit boards; testing; Circuit faults; Dictionaries; Integrated circuit modeling; Printed circuits; Probes; Testing; Vectors;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1983.6369937
  • Filename
    6369937
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1362682