Specifying an IVI class for digital test instrumentation

Author

Cadogan, Margaret ; Lopes, Teresa

Author_Institution

Teradyne Inc., Boston, MA, USA

Volume

15

Issue

7

fYear

2000

fDate

7/1/2000 12:00:00 AM

Firstpage

10

Lastpage

14

Abstract

This paper presents an overview of work being done by Teradyne in conjunction with the IVI Foundation to specify an IVI class for digital instrumentation. The Interchangeable Virtual Instruments (IVI) Foundation was formed in August 1997 to define standard specifications for programming common test instrument capabilities. The paper will present the major architectural aspects of digital test instrumentation and how those features can be grouped into classes for the purpose of writing an instrument independent driver. Topics discussed will include derivation of capability classes, class extensions, simulation, and range checking. Examples of how the IVI digital class would apply to the Teradyne M9-Series Digital Test Instrument will be included. Conclusions will summarize the unique attributes of digital test instrumentation, the benefits which can be achieved through standardization, and the tradeoffs associated with utilizing class extensions

Keywords

application program interfaces; automatic test equipment; automatic test software; device drivers; digital instrumentation; peripheral interfaces; standardisation; virtual instrumentation; ATE; IVI Foundation; IVI class specification; Interchangeable Virtual Instruments; TPS; Teradyne M9-Series instrument; application development environment; architectural aspects; capability classes; class extensions; common test instrument capabilities; digital bus emulation; digital test instrumentation; instrument independent driver; range checking; simulation; standard programming specifications; standardization; Costs; Instruments; Logic testing; Manufacturing; Protection; Standardization; System testing; Test equipment; Timing; Writing;

fLanguage

English

Journal_Title

Aerospace and Electronic Systems Magazine, IEEE

Publisher

ieee

ISSN

0885-8985

Type

jour

DOI

10.1109/62.854019

Filename

854019