• DocumentCode
    1362982
  • Title

    A vector approach for noise parameter fitting and selection of source admittances

  • Author

    Callaghan, Juan M O ; Mondal, Jyoti P.

  • Author_Institution
    SRC Honeywell Inc., Bloomington, MN, USA
  • Volume
    39
  • Issue
    8
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    1376
  • Lastpage
    1382
  • Abstract
    Simple vector concepts can be used in the determination of noise parameters from measured data. The use of such concepts leads to a simplification in the least-square fitting algorithm, complete determination of the admittance loci that produce ill conditioning, and simple criteria for the selection of source admittances that minimize the sensitivity of the noise parameters to experimental error. The sensitivity of the noise parameters to small perturbations in the reflection coefficients is compared for a group of source admittances presented in previous work. The results show that a great reduction in the error of the noise parameters can be achieved by properly selecting the source admittances
  • Keywords
    electric admittance; electric noise measurement; measurement errors; error sensitivity; least-square fitting algorithm; noise parameter fitting; reflection coefficients; source admittances; vector approach; Acoustic reflection; Admittance; Computer errors; Differential equations; Helium; Impedance; Noise figure; Noise measurement; Noise reduction; Vectors;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.85413
  • Filename
    85413