DocumentCode :
1363244
Title :
Enhanced Intercycle Switching in p-Cycle Survivability for WDM Networks
Author :
Yadav, Raghav ; Yadav, Rama Shankar ; Singh, Hari Mohan
Author_Institution :
Dept. of Comput. Sci. & I.T., Sam Higginbottom Inst. of Agric., Technol. & Sci. (SHIATS), Allahabad, India
Volume :
2
Issue :
11
fYear :
2010
fDate :
11/1/2010 12:00:00 AM
Firstpage :
961
Lastpage :
966
Abstract :
The p-cycle is the most promising technique used for the survivability of WDM networks. Relevant studies conducted by eminent researchers in this field have suggested that the reliability of the p-cycle can be enhanced further. In order to address the problem, the authors introduced a concept, namely, intercycle switching (ICS), that reduces the length of the p-cycle restoration segment by exploiting an idle p-cycle. This reduction implies a minimized restored path (end-to-end) length and thus improves the quality and reliability of optical transport networks. Through this paper, the authors show how the effectiveness of the ICS approach can be enhanced by considering the restored path during intercycle switching instead of the p-cycle restoration segment, namely, as enhanced ICS (EICS). Furthermore, the authors worked on the optimal allocation of the candidate p-cycle and idle p-cycle (OPIA) to the working paths to choose the restored path optimally where EICS is more effective.
Keywords :
optical communication equipment; optical fibre networks; telecommunication network reliability; telecommunication switching; wavelength division multiplexing; WDM Networks; end-to-end length; enhanced intercycle switching; minimized restored path length; optical transport networks; p-cycle restoration segment; p-cycle survivability; Integrated optics; Optical fiber networks; Optical switches; Optimized production technology; Reliability; Resource management; Enhanced intercycle switching (EICS); ICS; OPIA; Restored path; p-cycle;
fLanguage :
English
Journal_Title :
Optical Communications and Networking, IEEE/OSA Journal of
Publisher :
ieee
ISSN :
1943-0620
Type :
jour
DOI :
10.1364/JOCN.2.000961
Filename :
5611644
Link To Document :
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