DocumentCode
1363272
Title
High-Performance Junction Barrier Schottky Rectifier With Optimized Structure
Author
Wang, Ying ; Li, Ting ; Chen, Yu-xian ; Cao, Fei ; Liu, Yun-tao ; Shao, Lei
Author_Institution
Sch. of Electron. & Inf. Eng., Harbin Eng. Univ., Harbin, China
Volume
59
Issue
1
fYear
2012
Firstpage
114
Lastpage
120
Abstract
Junction barrier Schottky (JBS) rectifiers with p-well on 4H-SiC for improving the electrical performance are proposed. Compared with the common JBS rectifier, the devices show an increasing breakdown voltage due to a uniform electric field. Forward and reverse characteristics have been verified at room and elevated temperatures. As a result, the breakdown voltage of 1.9 kV was obtained for the JBS rectifier with the P+ grids on the p-well (POP), and that of the JBS rectifier with the P+ grids in the p-well (PIP) is about 1.6 kV. The forward voltage drops of the POP and PIP JBS rectifiers at a current density of 100 A/cm2 are 3 and 3.2 V, respectively. The POP and PIP JBS rectifiers have more than 3.3 ×1010 and 5.4 ×1010 on/off (1 V/ -500 V) current ratios, respectively. In addition, the output capacitance of the POP JBS rectifier at -3 V reduces about 15% relative to that of the common JBS rectifier. In addition, the figures of merit of the POP and PIP JBS rectifiers are about 4.1 times and 2.9 times that of the common JBS rectifier, respectively.
Keywords
Schottky barriers; electric fields; rectifiers; JBS rectifiers; junction barrier Schottky rectifier; optimized structure; uniform electric field; voltage 3 V; voltage 3.2 V; Capacitance; Current density; Doping; Leakage current; Schottky barriers; Silicon carbide; Temperature; Breakdown voltage; forward voltage drop; junction barrier schottky (JBS); output capacitance; p-well; specific on-resistance;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2011.2169963
Filename
6062405
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