Title :
Magneto-impedance in glass-coated CoMnSiB amorphous microwires
Author :
Vazquez, M. ; Zhukov, A.P. ; Aragoneses, P. ; Arcas, J. ; Garcia-Beneytez, J.M. ; Maria, Psiha ; Hernando, A.
Author_Institution :
CSIC, Madrid, Spain
fDate :
5/1/1998 12:00:00 AM
Abstract :
A magneto-impedance (MI) effect has been experimentally detected and systematically studied in Co68.5Mn0.5Si10 B15 glass-coated amorphous microwire 14 μm in diameter. The dependence of MI on a dc applied magnetic field (up to 20 Oe) for a range of values of ac current (less than 4 mA and having a frequency between 0.2 and 2.0 MHz) flowing along the microwire has been measured in as-prepared samples, as well as after heat treatments up to 400°C. A maximum relative change in MI of around 16% is observed in the optimum conditions, that is, for about 5 Oe dc axial applied field and 3 mA, 2 MHz ac current flowing along the microwire, which finally corresponds to a magnetic field sensitivity of about 0.4 V/Oe. Such modifications are interpreted considering the dependence of the skin-effect on those parameters through the induced changes in the circular permeability. MI in these ferromagnetic wires with micrometric dimension is of technological interest for local detection of magnetic fields
Keywords :
amorphous magnetic materials; boron alloys; cobalt alloys; ferromagnetic materials; giant magnetoresistance; heat treatment; magnetic permeability; manganese alloys; metallic glasses; silicon alloys; skin effect; 0.2 to 2.0 MHz; 14 mum; 4 mA; 400 C; Co68.5Mn0.5Si10B15; Co68.5Mn0.5Si10B15 glass-coated amorphous microwire; ac current; circular permeability; dc applied magnetic field; dc axial applied field; ferromagnetic wires; glass-coated CoMnSiB amorphous microwires; heat treatments; magnetic field sensitivity; magneto-impedance; micrometric dimension; skin-effect; Amorphous magnetic materials; Amorphous materials; Current measurement; Frequency measurement; Gas detectors; Heat treatment; Magnetic field measurement; Magnetic fields; Permeability; Wires;
Journal_Title :
Magnetics, IEEE Transactions on