DocumentCode :
1363416
Title :
High-frequency lamb wave device composed of MEMS structure using LiNbO3 thin film and air gap
Author :
Kadota, Michio ; Ogami, Takashi ; Yamamoto, Kansho ; Tochishita, Hikari ; Negoro, Yasuhiro
Author_Institution :
Murata Manuf. Co., Ltd., Kyoto, Japan
Volume :
57
Issue :
11
fYear :
2010
fDate :
11/1/2010 12:00:00 AM
Firstpage :
2564
Lastpage :
2571
Abstract :
High-frequency devices operating at 3 GHz or higher are required, for instance, for future 4th generation mobile phone systems in Japan. Using a substrate with a high acoustic velocity is one method to realize a high-frequency acoustic or elastic device. A Lamb wave has a high velocity when the substrate thickness is thin. To realize a high-frequency device operating at 3 GHz or higher using a Lamb wave, a very thin (less than 0.5 μm thick) single-crystal plate must be used. It is difficult to fabricate such a very thin single crystal plate. The authors have attempted to use a c-axis orientated epitaxial LiNbO3 thin film deposited by a chemical vapor deposition system (CVD) instead of using a thin LiNbO3 single crystal plate. Lamb wave resonators composed of a interdigital transducer (IDT)/the LiNbO3 film/air gap/base substrate structure like micro-electromechanical system (MEMS) transducers were fabricated. These resonators have shown a high frequency of 4.5 and 6.3 GHz, which correspond to very high acoustic velocities of 14 000 and 12 500 m/s, respectively, have excellent characteristics such as a ratio of resonant and antiresonant impedance of 52 and 38 dB and a wide band of 7.2% and 3.7%, respectively, and do not have spurious responses caused by the 0th modes of shear horizontal (SH0) and symmetric (S0) modes.
Keywords :
air gaps; chemical vapour deposition; epitaxial layers; interdigital transducers; lithium compounds; micromechanical resonators; piezoelectric thin films; surface acoustic wave resonators; surface acoustic wave transducers; surface acoustic waves; 4th generation mobile phone systems; Lamb wave resonators; LiNbO3; MEMS; air gap; c-axis orientated epitaxial thin film; chemical vapor deposition; frequency 3 GHz; frequency 4.5 GHz; frequency 6.3 GHz; high-prequency Lamb wave device; interdigital transducer; microelectromechanical system; resonant-antiresonant impedance ratio; shear horizontal modes; symmetric modes; velocity 12500 m/s; velocity 14000 m/s; very thin single crystal plate; Bandwidth; Couplings; Crystals; Films; Impedance; Resonant frequency; Substrates;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1722
Filename :
5611703
Link To Document :
بازگشت