Performance evaluation of high-power GaAs Schottky and silicon p-i-n rectifiers in hard- and soft-switching applications

The dynamic switching characteristics of high-power GaAs Schottky and silicon p-i-n rectifiers are studied at various temperatures. Devices were first characterized to measure forward and reverse I-V, C-V, reverse breakdown voltage, and reverse-recovery performance. The same devices were characterized for turn on and turn off in switching circuits designed to study the dynamic switching performances under hard- and soft-switching conditions at different temperatures. Advanced two-dimensional (2-D) mixed device and circuit simulations were used to study the internal plasma dynamics under boundary conditions imposed by the circuit operation. It is shown that for hard-switching applications, GaAs Schottky power rectifiers exhibit significantly reduced switching power losses compared to silicon p-i-n rectifiers. For soft-switching applications, there is not a significant difference in the switching power losses for these two devices. Diode performance at elevated temperatures is measured and simulated, and temperature dependencies of switching and conduction power losses are analyzed