• DocumentCode
    1363707
  • Title

    The Quantum and Classical Capacitance Limits of InSb and InAs Nanowire FETs

  • Author

    Khayer, M. Abul ; Lake, Roger K.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
  • Volume
    56
  • Issue
    10
  • fYear
    2009
  • Firstpage
    2215
  • Lastpage
    2223
  • Abstract
    A comparison of nanowire FETs (NWFETs) of identical geometries but operating in two different regimes, namely, the quantum capacitance (QC) and classical capacitance (CC) regimes, is presented. n-type InSb and InAs NWFETs up to ~50 nm in diameter operate in the QC limit (QCL), and the corresponding p-type NWFETs operate in the CC limit. Drive currents at a fixed gate overdrive for the n- and p-type devices are found to be well matched. Nevertheless, the p-type devices have twice the delay times, half the intrinsic cutoff frequencies, twice the power-delay products, and four to five times the energy-delay products of the n-type devices, assuming transport is ballistic. Analytical expressions are derived for the QC, the current, the charge, the power-delay product, the energy-delay product, the gate delay time, and the cutoff frequency for a single-moded device operating in the QCL. The expressions for the power-delay product, energy-delay product, and the cutoff frequency are fundamental limits for such devices.
  • Keywords
    capacitance; field effect transistors; indium compounds; nanowires; InAs; InSb; classical capacitance limit; energy-delay product; gate delay time; intrinsic cutoff frequencies; n-and p-type devices; nanowire FET; power-delay product; quantum capacitance; single-moded device; Cutoff frequency; Delay effects; Effective mass; FETs; Geometry; Lakes; Nanoscale devices; Quantum capacitance; Quantum cascade lasers; Wire; ${bf k} cdot {bf p}$ method; Band structure; InAs NWFETs; InSb nanowire FETs (NWFETs); classical capacitance (CC); effective mass; nanowires (NWs); quantum capacitance (QC);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2028401
  • Filename
    5232851