Title :
MEMS-Based Nanospray-Ionization Mass Spectrometer
Author :
Wright, Steven ; Syms, Richard R A ; Moseley, Richard ; Hong, Guodong ; Prey, Shane O. ; Boxford, William E. ; Dash, Neil ; Edwards, Peter
Author_Institution :
Microsaic Syst. Ltd., Guildford, UK
Abstract :
An electrospray-ionization mass spectrometer (ESI-MS) whose main components are all fabricated using silicon microelectromechanical systems (MEMS) techniques is demonstrated for the first time. The ion source consists of a microengineered alignment bench containing a V-groove mounting for a nanospray capillary, an ion-extraction electrode, and a pneumatic nebulizer. The vacuum interface consists of two plates, each carrying a 50-μm-diameter capillary, that are selectively etched and bonded together to provide a differentially pumped internal cavity. The quadrupole filter consists of a microfabricated frame that provides mountings for stainless-steel rods measuring 650 μm in diameter and 30 mm in length. Two different quadrupoles are compared: a first-generation bonded silicon device and a second-generation silicon-on-glass device with a Brubaker prefilter. Differential pumping of a MEMS component is demonstrated for the first time, atmospheric pressure ionization and ion transfer into vacuum are characterized, ESI-MS operation is demonstrated, and spectra are presented for a variety of compounds.
Keywords :
electromechanical filters; ionisation; mass spectrometers; micromechanical devices; stainless steel; Brubaker prefilter; V-groove mounting; atmospheric pressure ionization; differentially pumped internal cavity; ion source; ion transfer; ion-extraction electrode; microelectromechanical systems; microengineered alignment bench; nanospray-ionization mass spectrometer; pneumatic nebulizer; quadrupole filter; silicon-on-glass device; size 30 mm; size 50 mum; size 650 mum; stainless-steel rods; Fabrication; Ion sources; Ionization; Mass spectroscopy; Silicon; Electrospray; mass spectrometry; microelectromechanical systems (MEMS); quadrupole filter;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2010.2082501