• DocumentCode
    1363949
  • Title

    Instrumentation: VLSI chips present new challenges for testing, while personal computers and local networks lead to new approaches

  • Author

    Guterl, Fred

  • Author_Institution
    IEEE Spectrum, New York, NY, USA
  • Volume
    21
  • Issue
    1
  • fYear
    1984
  • Firstpage
    64
  • Lastpage
    67
  • Abstract
    Advances in test and measurement equipment are discussed. These include: new approaches using personal computers and local networks; the use of databases, particularly for VLSI testing; and the growing use of color-screen oscilloscopes.
  • Keywords
    automatic test equipment; cathode-ray oscilloscopes; computerised instrumentation; integrated circuit testing; measurement systems; VLSI testing; automatic test equipment; cathode ray oscilloscopes; color-screen oscilloscopes; computerised instrumentation; databases; integrated circuit testing; local networks; measurement systems; personal computers; test and measurement equipment; Companies; Computers; Image color analysis; Instruments; Software; Testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1984.6370143
  • Filename
    6370143
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1363949