Title :
Spanning the product life cycle: RASSP DFT
Author :
Sedmak, Richard M. ; Evans, John S.
Author_Institution :
Self-Test Sevices, Amblers, PA, USA
Abstract :
This article describes a design for testability process for the RASSP program that is highly automated and hierarchical and also spans the entire life cycle. It features a new construct, the test strategy diagram for managing the test process
Keywords :
design for testability; digital signal processing chips; life testing; logic design; RASSP program; design for testability; design for testability process; life cycle; product life cycle; test strategy diagram; Built-in self-test; Circuit faults; Circuit testing; Control systems; Current measurement; Design for testability; Feedback; Libraries; Life testing; System testing;
Journal_Title :
Design & Test of Computers, IEEE
