Title :
Symbolic Nodal Analysis of Circuits Using Pathological Elements
Author :
Wang, Hung-Yu ; Huang, Wen-Chung ; Chia, Nan-Hui
Author_Institution :
Dept. of Electron. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan
Abstract :
The nullor as a network element is useful in the synthesis and analysis of active networks. It can be used to formulate the system of equations for symbolic nodal analysis. This brief presents a systematic analytical technique that performs efficient nodal analysis for RLC -nullor-mirror networks directly without replacing the mirror elements with their nullor equivalents. It is conducive to achieving high-performance symbolic nodal analysis since the RLC-nullor-mirror representation possesses reduced circuit complexity compared to the RLC-nullor equivalent. The feasibility and validity are demonstrated by two representative current-mode and voltage-mode circuits.
Keywords :
RLC circuits; circuit complexity; current-mode circuits; equivalent circuits; RLC-nullor equivalent; RLC-nullor-mirror networks; active networks; circuit complexity; current-mode circuits; pathological elements; symbolic nodal analysis; voltage-mode circuits; Admittance; Analog circuits; Analytical models; Circuit theory; Equations; Mirrors; Pathology; $RLC!$ –nullor–mirror network; Pathological element; symbolic nodal analysis (NA);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2010.2082930
