مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1364018

Title :

P1149.4 Mixed-Signal Test Bus

Author :

Cron, Adam

Volume :

Issue :

fYear :

1996

Firstpage :

Keywords :

Assembly; Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Manufacturing; Observability; Pins; Proposals; Switches;

fLanguage :

English

Journal_Title :

Design & Test of Computers, IEEE

Publisher :

ieee

ISSN :

0740-7475

Type :

jour

DOI :

10.1109/MDT.1996.536100

Filename :

536100

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1364018