• DocumentCode
    1364022
  • Title

    Noise of the JFET amplifier

  • Author

    Levinzon, Felix A.

  • Author_Institution
    Endevco Corp., San Juan Capistrano, CA, USA
  • Volume
    47
  • Issue
    7
  • fYear
    2000
  • fDate
    7/1/2000 12:00:00 AM
  • Firstpage
    981
  • Lastpage
    985
  • Abstract
    By analyzing the different noise sources of the silicon JFET amplifier, engineering formulae for equivalent noise voltage referred to the input of the JFET amplifier are derived. Formulae are obtained for common signal source impedance and particularly for capacitance-type signal source impedance. If the parameters of the JFET, the signal source, and the load are known, these formulae can he used to estimate the overall noise of the JFET amplifier over a wide frequency band. The theoretical curve of the overall equivalent noise voltage spectral density at frequencies from 0.5 Hz to 50 kHz has good correlation to a measured experimental curve. The contribution of the different noise sources to the overall noise is shown. For modern low-noise JFET´s, 1/f noise prevails over the channel thermal noise at frequencies f⩽100 Hz. When using high-capacitance-type signal source impedance, contribution of the biasing resistor thermal noise to the overall noise predominates at low frequencies f⩾1 kHz and room temperature. At upper frequencies f⩾1 kHz, overall noise is due mainly to the JFET´s thermal channel noise
  • Keywords
    1/f noise; JFET circuits; circuit noise; thermal noise; wideband amplifiers; 0.5 Hz to 50 kHz; 1/f noise; JFET amplifier; biasing resistor; capacitance-type signal source impedance; channel noise; common signal source impedance; equivalent noise voltage; equivalent noise voltage spectral density; noise sources; thermal noise; Capacitance; Density measurement; Frequency estimation; Frequency measurement; Impedance; Low-frequency noise; Noise measurement; Silicon; Thermal resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.855453
  • Filename
    855453