• DocumentCode
    1364080
  • Title

    Dark Current Mechanism in Bulk GaInNAs Lattice Matched to GaAs

  • Author

    Tan, Lionel J J ; Soong, Wai Mun ; David, John P R ; Ng, Jo Shien

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
  • Volume
    58
  • Issue
    1
  • fYear
    2011
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    The reverse-bias current-voltage characteristics of a series of Ga1-xlnxNyAs1-y diodes with bandgap of between 0.87 and 1.04 eV are reported. At low bias, diffusion and generation-recombination currents are dominant at high and low temperatures, respectively. At high reverse bias, the dark current is insensitive to changes in temperature, which is indicative of tunneling current mechanisms. We also observe an exponential dependence of the dark current with the electric field in the mid-bias range for all our diodes, which may be explained by the Poole-Frenkel effect.
  • Keywords
    III-V semiconductors; Poole-Frenkel effect; electron-hole recombination; gallium compounds; indium compounds; photodiodes; tunnelling; GaAs; GaInNAs; Poole-Frenkel effect; bulk lattice; dark current mechanism; generation-recombination currents; photodiodes; reverse bias current-voltage characteristics; tunneling current mechanisms; Dark current; Gallium arsenide; Photodiodes; Photonic band gap; Temperature measurement; Tunneling; Dark currents; GaAs; dilute nitrides; photodiodes;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2086061
  • Filename
    5613170