Title :
Dark Current Mechanism in Bulk GaInNAs Lattice Matched to GaAs
Author :
Tan, Lionel J J ; Soong, Wai Mun ; David, John P R ; Ng, Jo Shien
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Abstract :
The reverse-bias current-voltage characteristics of a series of Ga1-xlnxNyAs1-y diodes with bandgap of between 0.87 and 1.04 eV are reported. At low bias, diffusion and generation-recombination currents are dominant at high and low temperatures, respectively. At high reverse bias, the dark current is insensitive to changes in temperature, which is indicative of tunneling current mechanisms. We also observe an exponential dependence of the dark current with the electric field in the mid-bias range for all our diodes, which may be explained by the Poole-Frenkel effect.
Keywords :
III-V semiconductors; Poole-Frenkel effect; electron-hole recombination; gallium compounds; indium compounds; photodiodes; tunnelling; GaAs; GaInNAs; Poole-Frenkel effect; bulk lattice; dark current mechanism; generation-recombination currents; photodiodes; reverse bias current-voltage characteristics; tunneling current mechanisms; Dark current; Gallium arsenide; Photodiodes; Photonic band gap; Temperature measurement; Tunneling; Dark currents; GaAs; dilute nitrides; photodiodes;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2010.2086061