DocumentCode :
1364140
Title :
A nonparametric approach to estimate system burn-in time
Author :
Chien, Wei Ting Kary ; Kuo, Way
Author_Institution :
Texas A&M Univ., College Station, TX, USA
Volume :
9
Issue :
3
fYear :
1996
fDate :
8/1/1996 12:00:00 AM
Firstpage :
461
Lastpage :
467
Abstract :
System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among components, but also among different subsystems and at the system level. There are two major disadvantages for performing the system burn-in: the high burn-in cost and the complicated failure rate function. This paper proposes a nonparametric approach to estimate the optimal system burn-in time. The Anderson-Darling statistic is used to check the constant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to “unimodalize” the failure rate curve. Given experimental data, the system burn-in time can be determined easily without going through complex parameter estimation and curve fittings
Keywords :
failure analysis; integrated circuit reliability; nonparametric statistics; Anderson-Darling statistic; constant failure rate; failure rate curve; nonparametric approach; pool-adjacent-violator algorithm; residual defects; system burn-in time; Bayesian methods; Cost function; Curve fitting; Failure analysis; Information analysis; Parameter estimation; Statistics; Stress; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.536117
Filename :
536117
Link To Document :
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