• DocumentCode
    1364246
  • Title

    Time-domain measurement of the electromagnetic properties of materials

  • Author

    Courtney, Clifton Carthelle

  • Author_Institution
    Voss Sci., Albuquerque, NM, USA
  • Volume
    46
  • Issue
    5
  • fYear
    1998
  • fDate
    5/1/1998 12:00:00 AM
  • Firstpage
    517
  • Lastpage
    522
  • Abstract
    A time-domain measurement and data-reduction technique is presented that can yield the broad-band frequency-dependent values of a sample material´s electrical properties (complex permittivity and permeability). The method uses the material´s response to the spectral content of a fast rise-time pulse to determine the frequency dependence of the complex relative permittivity (ετ) and permeability (μr). The measurement procedure and data-reduction scheme are described, and the derived material values for a sample material are given. The advantages of this method include a potentially lower equipment cost and the avoidance of awkward calibration procedures that are inherent in frequency-domain methods. Though the material examined was nonmagnetic, the procedure is general and rigorous (for low-loss materials, low dispersion over the bandwidth) for the determination of both electrical and magnetic properties
  • Keywords
    Fourier transforms; S-parameters; coaxial cables; dispersion (wave); magnetic permeability measurement; microwave measurement; permittivity measurement; time-domain analysis; broad-band frequency-dependent values; complex permittivity; complex relative permittivity; data-reduction technique; dispersion; electromagnetic properties; fast rise-time pulse; frequency dependence; low-loss materials; permeability; spectral content; time-domain measurement; Calibration; Costs; Electric variables measurement; Electromagnetic measurements; Frequency dependence; Frequency measurement; Magnetic materials; Permeability measurement; Permittivity measurement; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.668650
  • Filename
    668650