• DocumentCode
    1364974
  • Title

    Experimental Approach and Evaluation on Dynamic Reliability of PBGA Assembly

  • Author

    Yang, Ping ; Chen, Zixia

  • Author_Institution
    Lab. of Adv. Design, Jiangsu Univ., Zhenjiang, China
  • Volume
    56
  • Issue
    10
  • fYear
    2009
  • Firstpage
    2243
  • Lastpage
    2249
  • Abstract
    The aim of this paper is to provide a systematic method to perform experimental test and theoretical evaluation on fatigue characteristics of plastic-ball-grid-array (PBGA) assembly under random vibration. A specified PBGA assembly which contains different structural and material parameters was manufactured. The fatigue characteristics of PBGA assembly under random vibration were tested. Manson-Coffin empirically derived formula and rain-flow algorithm were used to achieve the fatigue life of solder joints. In the meantime, the failure curve (reliability-cycle number curve) can be obtained by using Weibull distribution method when PBGA assembly is on different working situation. Finally, life prediction of corner solder balls was deduced based on three-band technology and cumulative damage index. Test results lay a basis for high-reliability design of PBGA assembly for engineering application.
  • Keywords
    ball grid arrays; failure analysis; fatigue; plastic packaging; reliability; soldering; vibrations; Manson-Coffin empirical formula; PBGA assembly; Weibull distribution method; corner solder ball; cumulative damage index; dynamic reliability; failure curve; fatigue characteristic; fatigue life; plastic ball grid array assembly; rain-flow algorithm; random vibration; reliability-cycle number curve; solder joints; Assembly systems; Fatigue; Laboratories; Manufacturing; Microelectronics; Packaging; Soldering; Stress; Testing; Vibrations; Cumulative damage index (CDI); fatigue life characteristics; plastic-ball-grid-array (PBGA) assembly; random vibration; reliability;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2027974
  • Filename
    5233757