• DocumentCode
    1364996
  • Title

    Relationship Between Neutron Yield and Macroscale Pinch Dynamics of a 1.4-kJ Plasma Focus Over Hundreds of Pulses

  • Author

    Bures, Brian L. ; Krishnan, Mahadevan ; Madden, Robert E.

  • Author_Institution
    Alameda Appl. Sci. Corp., San Leandro, CA, USA
  • Volume
    39
  • Issue
    12
  • fYear
    2011
  • Firstpage
    3351
  • Lastpage
    3357
  • Abstract
    The plasma focus (PF) is a potent neutron source, but the reproducibility of the source is seldom studied over more than tens of shots. The data presented herein examine the PF at the same pressure, charge voltage, and electrode geometry over 930 shots. The neutron yield at 230 kA was found to be 5.6 × 107 neutrons/pulse with a standard deviation of 55%. The highest yield shots exceed 108 neutrons/pulse. Using terminal measurements of voltage and current, the time-varying inductance and the pinch voltage were derived. A linear relationship was found between the minimum in the time derivative of the current (dI/dt) and the pinch voltage. Increasing pinch voltage correlated with increasing neutron yield at the same peak current. Therefore, it is desirable to increase the (absolute) minimum in dI/dt and, thus, the current “bite” to increase the neutron yield. The large deviation in the neutron yield cannot be explained using terminal measurements alone, so time and spatially resolved diagnostics are needed to better understand if measurable macroscale properties such as pinch geometry provide insight into the neutron yield standard deviation.
  • Keywords
    neutron sources; pinch effect; plasma focus; current 230 kA; current measurements; energy 1.4 kJ; macroscale pinch dynamics; neutron source; neutron yield; pinch geometry; pinch voltage; plasma focus; spatially resolved diagnostics; time-varying inductance; voltage measurements; Current measurement; Inductance; Neutrons; Plasma properties; Plasmas; Probes; Neutron sources; plasma focus (PF);
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2011.2170588
  • Filename
    6064902