Title :
Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations With Imperfect Electrical Ports
Author :
Williams, Dylan F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare five rectangular-waveguide calibration and measurement strategies at sub-millimeter wavelengths that correct to differing degrees for electrical-port imperfections.
Keywords :
calibration; electric variables measurement; electromagnetic wave scattering; submillimetre wave devices; terahertz wave devices; waveguides; electrical port imperfections; imperfect electrical ports; measured scattering parameters; rectangular waveguide calibration strategies; rectangular waveguide measurement strategies; submillimeter wave scattering parameter calibrations; Accuracy; Apertures; Approximation methods; Calibration; Scattering parameters; Transmission line matrix methods; Transmission line measurements; Calibration; microwave; millimeter-wave; submillimeter wave; vector network analyzer;
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
DOI :
10.1109/TTHZ.2011.2167833
