Title :
Sensor Modeling, Low-Complexity Fusion Algorithms, and Mixed-Signal IC Prototyping for Gas Measures in Low-Emission Vehicles
Author :
Saponara, Sergio ; Petri, Esa ; Fanucci, Luca ; Terreni, Pierangelo
Author_Institution :
Dept. of Inf. Eng., Univ. of Pisa, Pisa, Italy
Abstract :
This paper addresses the detection of hydrogen leaks for safety warning systems in automotive applications and the measurement of nitrogen oxide concentration in exhaust gases of zero-emission vehicles. The presented approach is based on the development of accurate models (including nonlinearity and error sources of real building components) for all the system elements: sensors and acquisition chain. This methodology enables efficient design space exploration and sensitivity analysis, allowing an optimal analog-digital and hardware-software partitioning. Such analysis drives also the development of effective data fusion techniques to reduce the measure uncertainty (due to cross-sensitivity to other gases or to temperature/humidity variations). Such techniques have been implemented on a microcontroller-based mixed-signal embedded platform for intelligent sensor interfacing with limited complexity, suitable for automotive applications.
Keywords :
automotive engineering; chemical sensors; chemical variables measurement; intelligent sensors; leak detection; mixed analogue-digital integrated circuits; safety systems; sensitivity analysis; sensor fusion; vehicles; data fusion techniques; exhaust gases; gas measurement; hydrogen leaks detection; intelligent sensor; mixed-signal IC prototyping; nitrogen oxide concentration measurement; safety warning systems; sensitivity analysis; sensor modeling; zero-emission vehicles; Analytical models; Data models; Humidity; Integrated circuit modeling; Sensitivity; Temperature measurement; Temperature sensors; $hbox{H}_{2}$ acquisitions; $hbox{NO}_{x}$ acquisitions; Intelligent Sensor InterFace (ISIF); mixed-signal integrated circuit (IC); sensor fusion; sensor signal conditioning; zero-emission vehicles;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2010.2084230