DocumentCode :
1365705
Title :
Testing: Previously the most neglected area, chip testing must begin during the chip-design phase and continue through fabrication
Author :
Guterl, Fred
Volume :
21
Issue :
9
fYear :
1984
Firstpage :
40
Lastpage :
46
Abstract :
Designing and fabricating a very large-scale integrated chip in one month is pointless if the chip does not work. Yet methods of testing such a chip quickly and cheaply have received scant attention until recently, test engineers say. The area has suffered from both a lack of understanding by engineering managers of the importance of testing and a lack of computer tools to help the test engineer design test programs. The technologies for rapid design and fabrication of custom chips have far outpaced the technology of testing.
Keywords :
Circuit faults; Fabrication; Integrated circuit modeling; Production; Testing; Very large scale integration; Writing;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1984.6370462
Filename :
6370462
Link To Document :
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