DocumentCode
1365705
Title
Testing: Previously the most neglected area, chip testing must begin during the chip-design phase and continue through fabrication
Author
Guterl, Fred
Volume
21
Issue
9
fYear
1984
Firstpage
40
Lastpage
46
Abstract
Designing and fabricating a very large-scale integrated chip in one month is pointless if the chip does not work. Yet methods of testing such a chip quickly and cheaply have received scant attention until recently, test engineers say. The area has suffered from both a lack of understanding by engineering managers of the importance of testing and a lack of computer tools to help the test engineer design test programs. The technologies for rapid design and fabrication of custom chips have far outpaced the technology of testing.
Keywords
Circuit faults; Fabrication; Integrated circuit modeling; Production; Testing; Very large scale integration; Writing;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/MSPEC.1984.6370462
Filename
6370462
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