• DocumentCode
    1365705
  • Title

    Testing: Previously the most neglected area, chip testing must begin during the chip-design phase and continue through fabrication

  • Author

    Guterl, Fred

  • Volume
    21
  • Issue
    9
  • fYear
    1984
  • Firstpage
    40
  • Lastpage
    46
  • Abstract
    Designing and fabricating a very large-scale integrated chip in one month is pointless if the chip does not work. Yet methods of testing such a chip quickly and cheaply have received scant attention until recently, test engineers say. The area has suffered from both a lack of understanding by engineering managers of the importance of testing and a lack of computer tools to help the test engineer design test programs. The technologies for rapid design and fabrication of custom chips have far outpaced the technology of testing.
  • Keywords
    Circuit faults; Fabrication; Integrated circuit modeling; Production; Testing; Very large scale integration; Writing;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1984.6370462
  • Filename
    6370462