Title :
Testing: Previously the most neglected area, chip testing must begin during the chip-design phase and continue through fabrication
Abstract :
Designing and fabricating a very large-scale integrated chip in one month is pointless if the chip does not work. Yet methods of testing such a chip quickly and cheaply have received scant attention until recently, test engineers say. The area has suffered from both a lack of understanding by engineering managers of the importance of testing and a lack of computer tools to help the test engineer design test programs. The technologies for rapid design and fabrication of custom chips have far outpaced the technology of testing.
Keywords :
Circuit faults; Fabrication; Integrated circuit modeling; Production; Testing; Very large scale integration; Writing;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1984.6370462