• DocumentCode
    136580
  • Title

    Challenges and trends of high power IGBT module packaging

  • Author

    Wang, Yannan ; Wu, Yaowu ; Jones, Simon ; Dai, Xiaoyu ; Liu, Guo-Ping

  • Author_Institution
    Dynex Semicond. Ltd., Lincoln, UK
  • fYear
    2014
  • fDate
    Aug. 31 2014-Sept. 3 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Insulated gate bipolar transistor (IGBT) modules play an important role in many power systems, in which the performance and reliability are limiting factors to system application. Therefore, intensive investigation has been done on the packaging as it affects IGBT module characteristics. In this paper, the status, challenges and trends of packaging technologies for high power traction and industrial drive IGBT modules are discussed. It is suggested that the advanced joining and interconnection technologies for the future power module assembly will improve the module performance and reliability significantly.
  • Keywords
    insulated gate bipolar transistors; power bipolar transistors; semiconductor device packaging; semiconductor device reliability; high power IGBT module packaging; industrial drive IGBT modules; insulated gate bipolar transistor; power module assembly; Bonding; Copper; Insulated gate bipolar transistors; Packaging; Reliability; Substrates; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-4240-4
  • Type

    conf

  • DOI
    10.1109/ITEC-AP.2014.6940851
  • Filename
    6940851