• DocumentCode
    1365969
  • Title

    Keeping current with technology: Identifying re-host candidates

  • Author

    Kirkland, Larry V.

  • Author_Institution
    WesTest Eng., Farmington, UT, USA
  • Volume
    26
  • Issue
    10
  • fYear
    2011
  • Firstpage
    25
  • Lastpage
    29
  • Abstract
    How to identify when a static pattern digital test program should be re-hosted as a dynamic pattern set on the state-of-the-art ATE is complicated. However, there are critical issues that should be evaluated when making this decision. Issues include chip models, timing parameters, drive strength, logic levels, circuit complexity, I/O pins, automated diagnostics, portability, reuse, speed, optimal circuit coverage, schematics, and data availability.
  • Keywords
    automatic test equipment; circuit complexity; driver circuits; logic circuits; timing circuits; ATE; I/O pins; automated diagnostics; chip models; circuit complexity; drive strength; dynamic pattern set; logic levels; re host candidates; static pattern digital test program; timing parameters; Aerospace testing; Digital systems; Test facilities;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/MAES.2011.6065655
  • Filename
    6065655
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1365969