Title :
Bit error probability of OFDM system over frequency nonselective fast Rayleigh fading channels
Author :
Wan, Lei ; Dubey, V.K.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
fDate :
7/20/2000 12:00:00 AM
Abstract :
The variation in the channel impulse response during one OFDM symbol, which occurs in fast fading channel environments, destroys the orthogonality between the subcarriers. As a result, a complicated multiple distortion and an extra additive distortion component are introduced. A theoretical derivation of the BER formula is presented, which involves a proposed method for calculating the probability density function (PDF) of the sum of N (N⩾3) correlated Rayleigh random variables (RVs). The results obtained using the derived BER formula agree well with the simulation results
Keywords :
OFDM modulation; Rayleigh channels; digital radio; error statistics; transient response; BER formula; OFDM system; PDF; bit error probability; channel impulse response; correlated Rayleigh random variables; fast Rayleigh fading channels; frequency nonselective fading channels; probability density function;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20000944