Title :
Capacitance measurements and tree length estimation during electrical treeing in sub-picofarad samples
Author :
Sonerud, B. ; Bengtsson, Tord ; Blennow, J??rgen ; Gubanski, Stanislaw ; Nilsson, S.
Author_Institution :
Dept. of Mater. & Manuf. Technol., Chalmers Univ. of Technol., Goteborg, Sweden
fDate :
12/1/2009 12:00:00 AM
Abstract :
A method for measuring capacitance below 1 pF is presented, which is used to measure dielectric properties during electrical treeing in XLPE samples. The measured capacitance is compared with finite element computations and from these simulations a simple relationship between the capacitance increase and the tree length can be established which corresponds well to the tree length observed by optical microscopy.
Keywords :
XLPE insulation; capacitance measurement; finite element analysis; optical microscopy; trees (electrical); XLPE samples; capacitance measurements; cross linked polyethylene insulation; electrical treeing; finite element computations; optical microscopy; tree length estimation; Biomedical optical imaging; Capacitance measurement; Chemical technology; Dielectric measurements; Electric variables measurement; Impedance measurement; Length measurement; Optical microscopy; Trees - insulation; Voltage; Dielectric measurements, capacitance measurements, insulation testing, trees, cross linked polyethylene insulation;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2009.5361593
