Influence of the Carrier Phase on Flicker Measurement for Rectangular Voltage Fluctuations

Author

Ruiz, J. ; Lazkano, A. ; Gutierrez, J.J. ; Leturiondo, L.A. ; Azkarate, I. ; Saiz, P. ; Redondo, K.

Author_Institution

Dept. of Electron. & Telecommun., Univ. of the Basque Country (UPV/EHU), Bilbao, Spain

Volume

61

Issue

3

fYear

2012

fDate

3/1/2012 12:00:00 AM

Firstpage

629

Lastpage

635

Abstract

This paper presents an analysis of the influence of the phase relationship between the fundamental frequency and the rectangular voltage fluctuation on flicker measurements made by the International Electrotechnical Commission (IEC) flickermeter. We analytically studied the origin of the deviations for a set of significant fluctuation frequencies. We found that the nonlinear behavior of the squaring multiplier of the IEC flickermeter produces an additional dc component in instantaneous flicker sensation P_inst for several rectangular fluctuation frequencies. The value of this dc component depends on the phase relationship between the fundamental and the fluctuation frequency. The analysis of this paper has contributed to clarify the definition of some performance tests of the IEC flickermeter standard IEC 61000-4-15 ed.2. This will help develop calibration and verification methods for the flickermeters.

Keywords

IEC standards; calibration; power supply quality; power system measurement; voltage measurement; IEC 61000-4-15 ed.2 standard; IEC flickermeter; International Electrotechnical Commission flickermeter; calibration method; carrier phase; flicker measurement; instantaneous flicker sensation; rectangular fluctuation frequency; rectangular voltage fluctuation; Frequency measurement; Frequency modulation; IEC; IEC standards; Phase measurement; Voltage fluctuations; Voltage measurement; ${bf P}_{bf st}$; Flicker; International Electrotechnical Commission (IEC) flickermeter; power quality; rectangular voltage fluctuation;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2011.2171611

Filename

6065755