Title :
CMOS charge-transfer preamplifier for offset-fluctuation cancellation in low-power A/D converters
Author :
Kotani, Koji ; Shibata, Tadashi ; Ohmi, Tadahiro
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
fDate :
5/1/1998 12:00:00 AM
Abstract :
We have developed a low-power, high-accuracy comparator composed of a dynamic latch and a CMOS charge transfer preamplifier (CT preamplifier). The CT preamplifier amplifies the input signal with no static power dissipation, and the operation is almost insensitive to the device parameter fluctuations. The low-power and high-accuracy comparator has been realized by combining the CT preamplifier with a dynamic latch circuit. The fluctuation in the offset voltage of a dynamic latch is reduced by a factor of the preamplifier gain. A 4-bit flash A/D converter circuit has been designed and fabricated by 0.6-μm CMOS process. Low differential nonlinearity of less than ±4 mV has been verified by the measurements on test circuits, showing 8-bit resolution capability. Very low power operation at 4.3 μW per MS/s per comparator has also been achieved
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; comparators (circuits); preamplifiers; 0.6 micron; 4 bit; 4.3 muW; CMOS charge-transfer preamplifier; device parameter fluctuations; differential nonlinearity; dynamic latch circuit; flash A/D converter circuit; high-accuracy comparator; low-power A/D converters; offset voltage; offset-fluctuation cancellation; resolution capability; CMOS process; CMOS technology; Charge transfer; Circuit testing; Fluctuations; Histograms; Latches; Power dissipation; Preamplifiers; Threshold voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of