Title :
An access-sequence control scheme to enhance random-access performance of embedded DRAM´s
Author :
Ayukawa, Kazushige ; Watanabe, Takao ; Narita, Susumu
Author_Institution :
Central Res. Lab., Hitachi Ltd., Kokubunji, Japan
fDate :
5/1/1998 12:00:00 AM
Abstract :
An embedded DRAM enables a high data-transfer rate since it provides an on-chip wide-bus interconnection. However, the net data-transfer rate is reduced by page misses because of the inherently large row-access time of DRAM´s. We previously proposed a multibank DRAM macro based on a micromodule architecture to overcome this problem. The pipelined access of the DRAM macro is especially useful for regular access in graphics applications. In this paper, we propose an access-sequence control scheme which enhances the random-access performance of embedded DRAMs. Access ID numbers, an access queue register, and a write-data buffer combined with the multibank DRAM enable out-of-sequence access which reduces the page-miss penalty during random access. In the case of four successive accesses, the estimated total access time was, respectively, reduced by up to 38 and 32% for one and two page misses, and for five successive accesses with one or two page misses, it was, respectively, reduced by up to 44 and 45%
Keywords :
DRAM chips; storage management; access ID numbers; access queue register; access-sequence control scheme; embedded DRAM; high data-transfer rate; micromodule architecture; multibank DRAM macro; out-of-sequence access; page-miss penalty reduction; pipelined access; random-access performance enhancement; row-access time; write-data buffer; Application software; Computer graphics; Frequency; History; Image processing; Integrated circuit interconnections; Latches; Logic circuits; Multimedia systems; Random access memory;
Journal_Title :
Solid-State Circuits, IEEE Journal of