DocumentCode :
1366370
Title :
Enhancement in Light Emission From Hg–Cd–Te Due to Surface Patterning
Author :
Tonheim, Celin R. ; Sudbø, Aasmund S. ; Selvig, Espen ; Haakenaasen, Randi
Author_Institution :
Norwegian Defence Res. Establ. (FFI), Kjeller, Norway
Volume :
23
Issue :
1
fYear :
2011
Firstpage :
36
Lastpage :
38
Abstract :
Enhancement of light emission from HgCdTe due to surface patterning has been studied by means of photoluminescence (PL) spectroscopy. A triangular pattern of circular holes was etched into the CdTe layer grown on top of HgCdTe thin-film and multiple quantum well samples. Two different pattern lattice constants were used, giving lattice constant aG to emission wavelength ratios of 0.9, 1.2, and 2.1. The surface pattern was found to give 26%-35% enhancement in measured PL intensity.
Keywords :
II-VI semiconductors; cadmium compounds; lattice constants; mercury compounds; optical films; photoluminescence; semiconductor thin films; HgCdTe; lattice constants; light emission enhancement; photoluminescence spectroscopy; quantum well; surface patterning; Absorption; Gratings; Laser excitation; Light emitting diodes; Quantum well devices; Surface emitting lasers; Surface treatment; 2D grating; HgCdTe; integrated optics; photoluminescence;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2090517
Filename :
5617214
Link To Document :
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